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  Temperature- and time-resolved X-ray scattering at thin organic films

Bodenthin, Y., Grenzer, J., Lauter, R., Pietsch, U., Lehmann, P., Kurth, D. G., et al. (2002). Temperature- and time-resolved X-ray scattering at thin organic films. Journal of Synchrotron Radiation; Wiley-Blackwell on behalf of the IUCr, 9 (Part 4), 206-209. doi:10.1107/S090904950200794X.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-66B6-E Version Permalink: http://hdl.handle.net/21.11116/0000-0005-EA22-D
Genre: Journal Article

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20676.pdf (Publisher version), 536KB
 
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 Creators:
Bodenthin, Y., Author
Grenzer, J., Author
Lauter, R.1, Author              
Pietsch, U., Author
Lehmann, P.1, Author              
Kurth, D. G.1, Author              
Möhwald, H.2, Author              
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              
2Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863312              

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 Dates: 2002
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 20676
ISI: 000176471300004
DOI: 10.1107/S090904950200794X
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Title: Journal of Synchrotron Radiation; Wiley-Blackwell on behalf of the IUCr
  Alternative Title : J. Synchrot. Radiat.
Source Genre: Journal
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Publ. Info: Oxford : Blackwell Publishing
Pages: - Volume / Issue: 9 (Part 4) Sequence Number: - Start / End Page: 206 - 209 Identifier: ISSN: 1600-5775