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  X-ray reflectivity analysis of thin complex Langmuir-Blodgett films.

Poloucek, P., Pietsch, U., Geue, T., Symietz, C., & Brezesinski, G. (2001). X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of Physics D: Applied Physics, 34, 450-458. doi:10.1088/0022-3727/34/4/302.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-68D0-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-040C-C
Genre: Journal Article

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288210.pdf (Publisher version), 304KB
 
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 Creators:
Poloucek, P., Author
Pietsch, U., Author
Geue, T., Author
Symietz, C.1, Author           
Brezesinski, G.2, Author           
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              
2Gerald Brezesinski, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863310              

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 Dates: 2001
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 288210
Other: 40259
DOI: 10.1088/0022-3727/34/4/302
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Title: Journal of Physics D: Applied Physics
Source Genre: Journal
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Publ. Info: Bristol : IOP Publishing
Pages: - Volume / Issue: 34 Sequence Number: - Start / End Page: 450 - 458 Identifier: ISSN: 0022-3727
CoNE: https://pure.mpg.de/cone/journals/resource/0022-3727