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  Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films.

Flueraru, C., Schrader, S., Zauls, V., Motschmann, H., Stiller, B., & Kiebooms, R. (2000). Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films. Synthetic Metals, 111, 603-606. doi:10.1016/S0379-6779(99)00318-5.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-6A96-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0005-7AC7-2
Genre: Journal Article

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289893.pdf (Publisher version), 144KB
 
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2001
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 Creators:
Flueraru, C.1, Author           
Schrader, S., Author
Zauls, V., Author
Motschmann, H.1, Author           
Stiller, B., Author
Kiebooms, R., Author
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              

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Language(s):
 Dates: 2000
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 289893
Other: 28704
DOI: 10.1016/S0379-6779(99)00318-5
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Title: Synthetic Metals
  Other : Synth. Met.
Source Genre: Journal
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Publ. Info: Lausanne : Elsevier
Pages: - Volume / Issue: 111 Sequence Number: - Start / End Page: 603 - 606 Identifier: ISSN: 0379-6779