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  On the analysis of ellipsometric measurements of adsorption layers at fluid interfaces.

Teppner, R., Bae, S., Haage, K., & Motschmann, H. (1999). On the analysis of ellipsometric measurements of adsorption layers at fluid interfaces. Langmuir, 15(20), 7002-7007. doi:10.1021/la990232f.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-6E49-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0004-EF91-B
Genre: Journal Article

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291861.pdf (Publisher version), 76KB
 
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2000
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 Creators:
Teppner, R.1, Author              
Bae, S.1, Author              
Haage, K.1, Author              
Motschmann, H.1, Author              
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              

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Language(s):
 Dates: 1999
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 291861
Other: 17315
DOI: 10.1021/la990232f
 Degree: -

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Title: Langmuir
  Abbreviation : Langmuir
Source Genre: Journal
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Publ. Info: Columbus, OH : American Chemical Society
Pages: - Volume / Issue: 15 (20) Sequence Number: - Start / End Page: 7002 - 7007 Identifier: ISSN: 0743-7463