X-ray reflectivity study of layering transitions and the internal multilayer 
structure of films of three-block organosiloxane amphiphilic smectic liquid 
crystals at the air-water interface

Ibn-Elhaj, M.; Riegler, H.; Möhwald, H.; Schwendler, M.; Helm, C. A.

doi:10.1103/PhysRevE.56.1844

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X-ray reflectivity study of layering transitions and the internal multilayer structure of films of three-block organosiloxane amphiphilic smectic liquid crystals at the air-water interface

Ibn-Elhaj, M., Riegler, H., Möhwald, H., Schwendler, M., & Helm, C. A. (1997). X-ray reflectivity study of layering transitions and the internal multilayer structure of films of three-block organosiloxane amphiphilic smectic liquid crystals at the air-water interface. Physical Review E, 56(2), 1844-1852. doi:10.1103/PhysRevE.56.1844.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-7318-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-6720-A

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Creators:
Ibn-Elhaj, M.¹, Author
Riegler, H.², Author
Möhwald, H.³, Author
Schwendler, M., Author
Helm, C. A., Author

Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287
2Hans Riegler, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863311
3Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863312

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Dates: Date issued: 1997

Publication Status: Issued

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Identifiers: eDoc: 373944
ISI: A1997XR16000076
DOI: 10.1103/PhysRevE.56.1844

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Title: Physical Review E

Other : Phys. Rev. E

Source Genre: Journal

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Publ. Info: Melville, NY : American Physical Society

Pages: - Volume / Issue: 56 (2) Sequence Number: - Start / End Page: 1844 - 1852 Identifier: ISSN: 1539-3755
CoNE: https://pure.mpg.de/cone/journals/resource/954925225012