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  Numerical analysis of x-ray reflectivity data from organic thin films at interfaces

Asmussen, A., & Riegler, H. (1996). Numerical analysis of x-ray reflectivity data from organic thin films at interfaces. The Journal of Chemical Physics, 104(20), 8159-8164. doi:10.1063/1.471492.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-74C5-C Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-670C-9
Genre: Journal Article

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377347.pdf (Publisher version), 119KB
 
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 Creators:
Asmussen, A., Author
Riegler, H.1, Author              
Affiliations:
1Hans Riegler, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863311              

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 Dates: 1996
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 377347
ISI: A1996UL12500040
DOI: 10.1063/1.471492
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Title: The Journal of Chemical Physics
  Other : J. Chem. Phys.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Institute of Physics
Pages: - Volume / Issue: 104 (20) Sequence Number: - Start / End Page: 8159 - 8164 Identifier: ISSN: 0021-9606
CoNE: https://pure.mpg.de/cone/journals/resource/954922836226