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  X-ray reflectivity study of behenic acid Langmuir-Blodgett mono- and multilayers on SiO₂ surfaces as-deposited and after thermal treatment: Influence of substrate/film interactions on molecular ordering and film topology

Asmussen, A., & Riegler, H. (1996). X-ray reflectivity study of behenic acid Langmuir-Blodgett mono- and multilayers on SiO₂ surfaces as-deposited and after thermal treatment: Influence of substrate/film interactions on molecular ordering and film topology. The Journal of Chemical Physics, 104(20), 8151-8158. doi: 10.1063/1.471491.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-7516-0 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-670E-5
Genre: Journal Article

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377825.pdf (Publisher version), 357KB
 
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 Creators:
Asmussen, A., Author
Riegler, H.1, Author              
Affiliations:
1Hans Riegler, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863311              

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 Dates: 1996
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 377825
ISI: A1996UL12500039
DOI: 10.1063/1.471491
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Title: The Journal of Chemical Physics
  Other : J. Chem. Phys.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Institute of Physics
Pages: - Volume / Issue: 104 (20) Sequence Number: - Start / End Page: 8151 - 8158 Identifier: ISSN: 0021-9606
CoNE: https://pure.mpg.de/cone/journals/resource/954922836226