Kritische Analyse von Kontaktwinkelmessungen an Blattoberfächen

Vollhardt, D.

doi:10.1080/03235409309383050

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Kritische Analyse von Kontaktwinkelmessungen an Blattoberfächen

Vollhardt, D. (1993). Kritische Analyse von Kontaktwinkelmessungen an Blattoberfächen. Archives of phytopathology and plant protection, 28(3), 273-278. doi:10.1080/03235409309383050.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-7816-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-43BC-B

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Creators:
Vollhardt, D.¹, Author

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1Reinhard Miller, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863313

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Dates: Date issued: 1993

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Identifiers: eDoc: 392969
DOI: 10.1080/03235409309383050

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Title: Archives of phytopathology and plant protection

Source Genre: Journal

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Publ. Info: London : Taylor & Francis

Pages: - Volume / Issue: 28 (3) Sequence Number: - Start / End Page: 273 - 278 Identifier: ISSN: 0323-5408