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  Using electron beams to investigate catalytic materials

Zhang, B., & Su, D. S. (2014). Using electron beams to investigate catalytic materials. Comptes Rendus Physique, 15(2-3), 258-268. doi:10.1016/j.crhy.2013.11.001.

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Genre: Zeitschriftenartikel
Andere : Apports de la microscopie électronique à l'étude des matériaux catalytiques

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 Urheber:
Zhang, B.1, Autor
Su, Dang Sheng1, 2, Autor           
Affiliations:
1Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, China , ou_persistent22              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Schlagwörter: Electron microscopy; Catalyst; Chemical composition; Surface; Dynamic process; Particle shape
 Zusammenfassung: Electron microscopy (EM) enables us, not only to reveal the morphology, but also to provide structural, chemical and electronic information about solid catalysts at the atomic level, providing a dramatic driving force for the development of heterogeneous catalysis. Almost all catalytic materials have been studied with EM in order to obtain information about their structures, which can help us to establish the synthesis-structure-property relationships and to design catalysts with new structures and desired properties. Herein, several examples will be reviewed to illustrate the investigation of catalytic materials by using electron beams.

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Sprache(n): eng - English
 Datum: 2014-01-282014-02
 Publikationsstatus: Erschienen
 Seiten: 11
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1016/j.crhy.2013.11.001
 Art des Abschluß: -

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Quelle 1

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Titel: Comptes Rendus Physique
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Paris, France : Elsevier Masson SAS
Seiten: - Band / Heft: 15 (2-3) Artikelnummer: - Start- / Endseite: 258 - 268 Identifikator: ISSN: 1631-0705
CoNE: https://pure.mpg.de/cone/journals/resource/110978984566971