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  Reliable optical characterization of e-beam evaporated TiO2 films deposited at different substrate temperatures

Amotchkina, T. V., Trubetskov, M. K., Tikhonravov, A., Angelov, I. B., & Pervak, V. (2013). Reliable optical characterization of e-beam evaporated TiO2 films deposited at different substrate temperatures. Applied Optics, 53(4), A8-A15. doi:10.1364/AO.53.0000A8.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-E435-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-E438-6
Genre: Journal Article

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4730.pdf (Publisher version), 981KB
 
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 Creators:
Amotchkina, Tatiana V.1, Author           
Trubetskov, Michael K.1, Author           
Tikhonravov, A.2, Author
Angelov, Ivan B.1, Author           
Pervak, V.2, Author
Affiliations:
1Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              
2external, ou_persistent22              

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 Dates: 2013-09-232013-08-092013-09-242013-10-11
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: ISI: 000330484500002
DOI: 10.1364/AO.53.0000A8
URI: http://www.opticsinfobase.org/ao/abstract.cfm?uri=ao-53-4-A8
Other: 4730
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Title: Applied Optics
Source Genre: Journal
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Publ. Info: Washington, DC : Optical Society of America
Pages: - Volume / Issue: 53 (4) Sequence Number: - Start / End Page: A8 - A15 Identifier: ISSN: 0003-6935
CoNE: https://pure.mpg.de/cone/journals/resource/991042728167604