An analytical depth resolution function for the MRI model

Liu, Y.; Hofmann, S.; Wang, J. Y.

doi:10.1002/sia.5319

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An analytical depth resolution function for the MRI model

Liu, Y., Hofmann, S., & Wang, J. Y. (2013). An analytical depth resolution function for the MRI model. Surface and Interface Analysis, 45(11-12), 1659-1660. doi:10.1002/sia.5319.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-8766-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-8C23-B

Genre: Journal Article

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Creators:
Liu, Y.¹, Author
Hofmann, S.², Author
Wang, J. Y.¹, Author

Affiliations:
1Department of Physics, Shantou University, Shantou, Guangdong, China, ou_persistent22
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497650

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Free keywords: Emeriti and Others

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Dates: Date issued: 2013-11

Publication Status: Issued

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Identifiers: ISI: 000325611100001
DOI: 10.1002/sia.5319

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Title: Surface and Interface Analysis

Source Genre: Journal

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Publ. Info: New York, NY : John Wiley & Sons

Pages: - Volume / Issue: 45 (11-12) Sequence Number: - Start / End Page: 1659 - 1660 Identifier: ISSN: 0142-2421
CoNE: https://pure.mpg.de/cone/journals/resource/954925471358