Quality control of oblique incidence optical coatings based on normal incidence 
measurement data

Amotchkina, Tatiana V.; Trubetskov, Michael K.; Tikhonravov, Alexander V.; Schlichting, Sebastian; Ehlers, Henrik; Ristau, Detlev; Death, David; Francis, Robert J.; Pervak, Vladimir

doi:10.1364/OE.21.021508

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Quality control of oblique incidence optical coatings based on normal incidence measurement data

Amotchkina, T. V., Trubetskov, M. K., Tikhonravov, A. V., Schlichting, S., Ehlers, H., Ristau, D., et al. (2013). Quality control of oblique incidence optical coatings based on normal incidence measurement data. Optics Express, 21(18), 21508-21522. doi:10.1364/OE.21.021508.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-79BC-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-79C0-6

Genre: Journal Article

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Creators:
Amotchkina, Tatiana V.¹, Author
Trubetskov, Michael K.², Author
Tikhonravov, Alexander V.¹, Author
Schlichting, Sebastian¹, Author
Ehlers, Henrik¹, Author
Ristau, Detlev¹, Author
Death, David¹, Author
Francis, Robert J.¹, Author
Pervak, Vladimir¹, Author

Affiliations:
1external, ou_persistent22
2Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564

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Language(s): eng - English

Dates: Modified: 2013-08-29Submitted: 2013-07-15Accepted: 2013-08-29Published Online: 2013-09-09

Publication Status: Published online

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Rev. Type: Peer

Identifiers: ISI: 000324867100115
DOI: 10.1364/OE.21.021508
Other: 4748

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Title: Optics Express

Source Genre: Journal

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Publ. Info: Washington, DC : Optical Society of America

Pages: - Volume / Issue: 21 (18) Sequence Number: - Start / End Page: 21508 - 21522 Identifier: ISSN: 1094-4087
CoNE: https://pure.mpg.de/cone/journals/resource/954925609918