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Abstract:
The electronic properties of buried magnetic nano-layers were studied
using the linear magnetic dichroism in the angular distribution of
photoemittecl Fe, Co, and Mn 2p electrons from a CoFe-Ir78Mn22
multi-layered sample. The buried layers were probed using hard X-ray
photoelectron spectroscopy. HAXPES, at the undulator beamline P09 of the
3rd generation storage ring PETRA III. The results demonstrate that this
magnetometry technique can be used as a sensitive element specific probe
for magnetic properties suitable for application to buried ferromagnetic
and antiferromagnetic magnetic materials and multilayered spintronics
devices. Using the same instrument, spin-resolved Fe 2p HAXPES spectra
were obtained from the buried layer with good signal quality. (C) 2011
Elsevier B.V. All rights reserved.
