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Abstract:
The spin-resolved electronic structure of buried magnetic layers is
studied by hard X-ray photoelectron spectroscopy (HAXPES) using a spin
polarimeter in combination with a high-energy hemispherical electron
analyzer at the high-brilliance BL47XU beamline (SPring-8, Japan).
Spin-resolved photoelectron spectra are analyzed in comparison with the
results of magnetic linear and circular dichroism in photoelectron
emission in the case of buried Co2FeAl0.5Si0.5 layers. The relatively
large inelastic mean free path (up to 20 nm) of fast photoelectrons
enables us to extend the HAXPES technique with electron-spin polarimetry
and to develop spin analysis techniques for buried magnetic multilayers
and interfaces. (C) 2012 The Japan Society of Applied Physics