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  Electrical characterization of different DEPFET designs on die level

Bergbauer, B., Aschauer, S., Bähr, A., Hermenau, K., Horstmann, J., Lauf, T., et al. (2014). Electrical characterization of different DEPFET designs on die level. Journal of Instrumentation, 9: C01020, 1-8.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-C6F0-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-C729-9
Genre: Conference Paper

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 Creators:
Bergbauer, B.1, Author              
Aschauer, S., Author
Bähr, A.1, Author              
Hermenau, K., Author
Horstmann, J., Author
Lauf, T.1, Author              
Lechner, P., Author
Majewski, P., Author
Meidinger, N.1, Author              
Reiffers, J.1, Author              
Richter, R., Author
Sandow, C., Author
Schaller, G., Author
Schopper, F., Author
Stefanescu, A.1, Author              
Strüder, L., Author
Treis, J., Author
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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Language(s): eng - English
 Dates: 2014-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1088/1748-0221/9/01/C01020
Other: LOCALID: 1982853
 Degree: -

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Title: 15th International Workshop on Radiation Imaging Detectors (IWORID)
Place of Event: Paris, France
Start-/End Date: 2013-06-23 - 2013-06-27

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Title: Journal of Instrumentation
  Alternative Title : J inst
Source Genre: Journal
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Pages: - Volume / Issue: 9 Sequence Number: C01020 Start / End Page: 1 - 8 Identifier: ISSN: 1748-0221