X-ray diffraction pattern of doughs from strong and weak flours

Carlisle, C. H.; Holmes, Kenneth C.; Hutchinson, J. B.

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X-ray diffraction pattern of doughs from strong and weak flours

Carlisle, C. H., Holmes, K. C., & Hutchinson, J. B. (1962). X-ray diffraction pattern of doughs from strong and weak flours. Chemistry in Industry, 1216-1217.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-B203-B Version Permalink: https://hdl.handle.net/21.11116/0000-0001-DBD8-5

Genre: Journal Article

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Creators:
Carlisle, C. H., Author
Holmes, Kenneth C.^{1, 2, 3}, Author
Hutchinson, J. B., Author

Affiliations:
1Emeritus Group Biophysics, Max Planck Institute for Medical Research, Max Planck Society, Jahnstrasse 29, 69120 Heidelberg, DE, ou_1497712
2Muscle Research, Max Planck Institute for Medical Research, Max Planck Society, Jahnstrasse 29, 69120 Heidelberg, DE, ou_1497731
3Protein Cristallography XDS, Max Planck Institute for Medical Research, Max Planck Society, Jahnstrasse 29, 69120 Heidelberg, DE, ou_1497735

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Language(s): eng - English

Dates: Date issued: 1962

Publication Status: Issued

Pages: 2

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Title: Chemistry in Industry

Alternative Title : Chemistry in Industry

Source Genre: Journal

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1216 - 1217 Identifier: -