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  Temperature dependence of stoichiometry of laser ablated YBa2Cu3O7−x thin films

Scott, K., Mackenzie, A. P., Dineen, C., & Phillips, W. (1991). Temperature dependence of stoichiometry of laser ablated YBa2Cu3O7−x thin films. Physica C-Superconductivity and its Applications, 185, 1983-1984. doi:10.1016/0921-4534(91)91116-L.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-E7E6-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-E7E8-6
Genre: Journal Article

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 Creators:
Scott, K.1, Author
Mackenzie, A. P.2, Author              
Dineen, C.1, Author
Phillips, W.A.1, Author
Affiliations:
1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: Most of the analytical technique used in thin film research are insensitive to oxygen, and many are prone to thickness-dependent systematic errors. Electron Probe Microanalysis (EPMA) can give accurate analyses of thin films if sufficiently low accelerating voltages are used. We have used the technique to study whether fine stoichiometric changes are responsible for the quality differences that are observed in YBa2Cu3O7-x thin films produced at different substrate temperatures.

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 Dates: 1991-12-01
 Publication Status: Published in print
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Title: Physica C-Superconductivity and its Applications
  Other : Physica C
Source Genre: Journal
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Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 185 Sequence Number: - Start / End Page: 1983 - 1984 Identifier: ISSN: 0921-4534
CoNE: /journals/resource/954925564683