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  A Method to Overcome the Problem of Small Sample Tilts in Light Element Electron Microprobe Analysis

Mackenzie, A. P. (1990). A Method to Overcome the Problem of Small Sample Tilts in Light Element Electron Microprobe Analysis. In Proceedings of the XIIth International Conference on Electron Microscopy (pp. 221). San Francisco Press.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-E855-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-E857-6
Genre: Conference Paper

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Mackenzie, A. P.1, Author              
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1External Organizations, ou_persistent22              

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 Dates: 1990-01-01
 Publication Status: Published in print
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Title: Proceedings of the XIIth International Conference on Electron Microscopy
Source Genre: Proceedings
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Publ. Info: San Francisco Press
Pages: - Volume / Issue: 2 Sequence Number: - Start / End Page: 221 Identifier: -