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  Wide-area scanner for high-speed atomic force microscopy

Watanabe, H., Uchihashi, T., Kobashi, T., Shibata, M., Nishiyama, J., Yasuda, R., et al. (2013). Wide-area scanner for high-speed atomic force microscopy. Review of Scientific Instruments, 84(5), 053702-053705. doi:10.1063/1.4803449.

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Watanabe, H., Autor
Uchihashi, T., Autor
Kobashi, T., Autor
Shibata, M., Autor
Nishiyama, J., Autor
Yasuda, R.1, Autor
Ando, T., Autor
Affiliations:
1Max Planck Florida Institute for Neuroscience, Max Planck Society, One Max Planck Way, Jupiter FL 33458, USA, ou_1950288              

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Schlagwörter: Actins/metabolism, Bacillus subtilis/cytology, Bacteriolysis, Endocytosis, HeLa Cells, Humans, Microscopy, Atomic Force/*instrumentation
 Zusammenfassung: High-speed atomic force microscopy (HS-AFM) has recently been established. The dynamic processes and structural dynamics of protein molecules in action have been successfully visualized using HS-AFM. However, its maximum scan ranges in the X- and Y-directions have been limited to ~1 mum and ~4 mum, respectively, making it infeasible to observe the dynamics of much larger samples, including live cells. Here, we develop a wide-area scanner with a maximum XY scan range of ~46 x 46 mum(2) by magnifying the displacements of stack piezoelectric actuators using a leverage mechanism. Mechanical vibrations produced by fast displacement of the X-scanner are suppressed by a combination of feed-forward inverse compensation and the use of triangular scan signals with rounded vertices. As a result, the scan speed in the X-direction reaches 6.3 mm/s even for a scan size as large as ~40 mum. The nonlinearity of the X- and Y-piezoelectric actuators' displacements that arises from their hysteresis is eliminated by polynomial-approximation-based open-loop control. The interference between the X- and Y-scanners is also eliminated by the same technique. The usefulness of this wide-area scanner is demonstrated by video imaging of dynamic processes in live bacterial and eukaryotic cells.

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 Datum: 2013
 Publikationsstatus: Erschienen
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 Art der Begutachtung: Expertenbegutachtung
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Titel: Review of Scientific Instruments
Genre der Quelle: Zeitschrift
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Affiliations:
Ort, Verlag, Ausgabe: Woodbury, N.Y. [etc.] : American Institute of Physics
Seiten: - Band / Heft: 84 (5) Artikelnummer: - Start- / Endseite: 053702 - 053705 Identifikator: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452