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  High Throughput Quantification of Grain Boundary Segregation by Correlative TEM and APT

Herbig, M., Raabe, D., Li, Y., Choi, P., Zaefferer, S., & Goto, S. (2014). High Throughput Quantification of Grain Boundary Segregation by Correlative TEM and APT. Talk presented at TMS 2014, Solid-State Interfaces III Symposium. San Diego, CA, USA. 2014-02-20.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-1FBC-9 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-47CB-0
Genre: Talk

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 Creators:
Herbig, M.1, Author              
Raabe, D.2, Author              
Li, Y.1, 3, Author              
Choi, P.1, Author              
Zaefferer, S.4, Author              
Goto, S.2, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
3Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392              
4Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
 Dates: 2014-02
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 680497
 Degree: -

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Title: TMS 2014, Solid-State Interfaces III Symposium
Place of Event: San Diego, CA, USA
Start-/End Date: 2014-02-20

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