X-ray μLaue: A novel view on fatigue damage at the micron scale

Kirchlechner, Christoph; Liegl, Wolfgang; Motz, Christian; Dehm, Gerhard

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X-ray μLaue: A novel view on fatigue damage at the micron scale

Kirchlechner, C., Liegl, W., Motz, C., & Dehm, G. (2013). X-ray μLaue: A novel view on fatigue damage at the micron scale. Talk presented at ECI on Nanomechanical Testing 2013. Olhão (Algarve), Portugal. 2013-10-06 - 2013-10-11.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-20F6-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-AB45-7

Genre: Talk

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Creators:
Kirchlechner, Christoph¹, Author
Liegl, Wolfgang², Author
Motz, Christian³, Author
Dehm, Gerhard⁴, Author

Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
3Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Created: 2013

Publication Status: Not specified

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Identifiers: eDoc: 669715

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Title: ECI on Nanomechanical Testing 2013

Place of Event: Olhão (Algarve), Portugal

Start-/End Date: 2013-10-06 - 2013-10-11

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