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  In-situ squared: multi property thin film measurements during straining

Cordill, M. J., Glushko, O., Kreith, J., Marx, V. M., Kirchlechner, C., Zizak, I., et al. (2013). In-situ squared: multi property thin film measurements during straining. Talk presented at Nano- and Micromechanical Testing in Materials Research and Development IV. Olhão, Portugal. 2013-10-06 - 2013-10-11.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-210E-D Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-D2CB-D
Genre: Talk

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 Creators:
Cordill, M. J.1, Author
Glushko, O.1, Author
Kreith, J., Author
Marx, V. M.2, Author              
Kirchlechner, C.3, Author              
Zizak, I., Author
Struntz, T., Author
Fantner, E., Author
Affiliations:
1Max Planck Society, ou_persistent13              
2Structure and Micro-/Nanomechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
3Nano-/Micromechanics of Materials, Structure and Micro-/Nanomechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              

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Language(s): eng - English
 Dates: 2013
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 681731
 Degree: -

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Title: Nano- and Micromechanical Testing in Materials Research and Development IV
Place of Event: Olhão, Portugal
Start-/End Date: 2013-10-06 - 2013-10-11

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