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  Atomic resolution interface study of VN and Cu films on MgO using Cs corrected TEM

Dehm, G. (2013). Atomic resolution interface study of VN and Cu films on MgO using Cs corrected TEM. Talk presented at Microscopy Conference MC 2013. Regensburg, Germany. 2013-08-25 - 2013-08-30.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-21FA-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-AB1B-7
Genre: Talk

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 Creators:
Dehm, Gerhard1, Author              
Affiliations:
1Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2013
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 669374
 Degree: -

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Title: Microscopy Conference MC 2013
Place of Event: Regensburg, Germany
Start-/End Date: 2013-08-25 - 2013-08-30
Invited: Yes

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