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  A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction

Kirchlechner, C., Motz, C., & Dehm, G. (2013). A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction. Talk presented at GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects. MPIE, Düsseldorf, Germany. 2013-07-18 - 2013-07-19.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2274-0 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-AB1D-3
Genre: Talk

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 Creators:
Kirchlechner, Christoph1, Author              
Motz, Christian2, Author              
Dehm, Gerhard3, Author              
Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2013
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 669349
 Degree: -

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Title: GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects
Place of Event: MPIE, Düsseldorf, Germany
Start-/End Date: 2013-07-18 - 2013-07-19

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