A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction

Kirchlechner, Christoph; Motz, Christian; Dehm, Gerhard

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A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction

Kirchlechner, C., Motz, C., & Dehm, G. (2013). A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction. Talk presented at GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects. MPIE, Düsseldorf, Germany. 2013-07-18 - 2013-07-19.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2274-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-AB1D-3

Genre: Talk

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Creators:
Kirchlechner, Christoph¹, Author
Motz, Christian², Author
Dehm, Gerhard³, Author

Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Created: 2013

Publication Status: Not specified

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Identifiers: eDoc: 669349

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Title: GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects

Place of Event: MPIE, Düsseldorf, Germany

Start-/End Date: 2013-07-18 - 2013-07-19

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