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  Coupled high resolution strain and microstructure mapping based on digital image correlation and electron backscatter diffraction

Yan, D., Tasan, C. C., & Raabe, D. (2013). Coupled high resolution strain and microstructure mapping based on digital image correlation and electron backscatter diffraction. Talk presented at IMPRS-SurMat Seminar. Meschede, Germany. 2013-07-17 - 2013-07-19.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2298-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-3414-5
Genre: Talk

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 Creators:
Yan, D.1, Author              
Tasan, C. C.1, Author              
Raabe, D.2, Author              
Affiliations:
1Adaptive Structural Materials (Experiment), Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863382              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 673795
 Degree: -

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Title: IMPRS-SurMat Seminar
Place of Event: Meschede, Germany
Start-/End Date: 2013-07-17 - 2013-07-19

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