Coupled high resolution strain and microstructure mapping based on digital 
image correlation and electron backscatter diffraction

Yan, D.; Tasan, C. C.; Raabe, D.

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Coupled high resolution strain and microstructure mapping based on digital image correlation and electron backscatter diffraction

Yan, D., Tasan, C. C., & Raabe, D. (2013). Coupled high resolution strain and microstructure mapping based on digital image correlation and electron backscatter diffraction. Talk presented at IMPRS-SurMat Seminar. Meschede, Germany. 2013-07-17 - 2013-07-19.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2298-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-3414-5

Genre: Vortrag

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Urheber:
Yan, D.¹, Autor
Tasan, C. C.¹, Autor
Raabe, D.², Autor

Affiliations:
1Adaptive Structural Materials (Experiment), Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863382
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381