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  An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry

Zuo, J., Chen, Y., Lin, C.-J., & Erbe, A. (2013). An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry. Journal of Electrochemistry, 19(5), 409-417.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2410-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-3C95-1
Genre: Journal Article

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 Creators:
Zuo, J.1, Author              
Chen, Y.1, Author              
Lin, C.-J., Author
Erbe, A.2, Author              
Affiliations:
1External Organizations, ou_persistent22              
2Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): zho - Chinese
 Dates: 2013-04-22
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 670155
 Degree: -

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Title: Journal of Electrochemistry
  Alternative Title : J. Electrochem.
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 19 (5) Sequence Number: - Start / End Page: 409 - 417 Identifier: -