An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry

Zuo, J.; Chen, Y.; Lin, C.-J.; Erbe, A.

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An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry

Zuo, J., Chen, Y., Lin, C.-J., & Erbe, A. (2013). An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry. Journal of Electrochemistry, 19(5), 409-417.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2410-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-3C95-1

Genre: Journal Article

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Creators:
Zuo, J.¹, Author
Chen, Y.¹, Author
Lin, C.-J., Author
Erbe, A.², Author

Affiliations:
1External Organizations, ou_persistent22
2Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358

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Language(s): zho - Chinese

Dates: Date issued: 2013-04-22

Publication Status: Issued

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Identifiers: eDoc: 670155

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Title: Journal of Electrochemistry

Alternative Title : J. Electrochem.

Source Genre: Journal

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Pages: - Volume / Issue: 19 (5) Sequence Number: - Start / End Page: 409 - 417 Identifier: -