English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Characterization of Cu(In,Ga)Se2 grain boundaries using atom probe tomography

Cojocaru-Mirédin, O., Schwarz, T., Choi, P., Würz, R., & Raabe, D. (2013). Characterization of Cu(In,Ga)Se2 grain boundaries using atom probe tomography. Poster presented at 2013 MRS Spring Meeting & Exhibit, San Francisco, CA, USA.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2440-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-9162-B
Genre: Poster

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Cojocaru-Mirédin, O.1, Author              
Schwarz, T.2, Author              
Choi, P.2, Author              
Würz, R., Author
Raabe, D.3, Author              
Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2013-04
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 655852
 Degree: -

Event

show
hide
Title: 2013 MRS Spring Meeting & Exhibit
Place of Event: San Francisco, CA, USA
Start-/End Date: 2013-04-01 - 2013-04-05

Legal Case

show

Project information

show

Source

show