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  Investigation of Electrochemical Oxygen Reduction on Semiconductor Surfaces by Attenuated Total Internal Reflection Infrared Spectroscopy

Nayak, S. (2013). Investigation of Electrochemical Oxygen Reduction on Semiconductor Surfaces by Attenuated Total Internal Reflection Infrared Spectroscopy. PhD Thesis, Fakultät für Chemie und Biochemie, Ruhr-Universität Bochum, Bochum, Germany.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2464-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2466-F
Genre: Thesis

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 Creators:
Nayak, S.1, Author              
Stratmann, M.2, Advisor              
Havenith, M., Advisor
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              
2Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

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Language(s): eng - English
 Dates: 2013-03-18
 Publication Status: Accepted / In Press
 Pages: 137
 Publishing info: Bochum, Germany : Fakultät für Chemie und Biochemie, Ruhr-Universität Bochum
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 636415
 Degree: PhD

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