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  A mechanistic study of the electrochemical oxygen reduction on the model semiconductor n-Ge(100) by ATR-IR and DFT

Nayak, S., Biedermann, P. U., Stratmann, M., & Erbe, A. (2013). A mechanistic study of the electrochemical oxygen reduction on the model semiconductor n-Ge(100) by ATR-IR and DFT. Physical Chemistry Chemical Physics, 15(16), 5771-5781. doi:10.1039/C2CP43909C.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2562-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002C-E04E-4
Genre: Journal Article

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 Creators:
Nayak, S.1, Author              
Biedermann, P. U.2, Author              
Stratmann, M.3, Author              
Erbe, A.1, Author              
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350              
3Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

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Language(s): eng - English
 Dates: 2013-01-04
 Publication Status: Published in print
 Pages: 11
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 644894
DOI: 10.1039/C2CP43909C
 Degree: -

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Title: Physical Chemistry Chemical Physics
  Abbreviation : Phys. Chem. Chem. Phys.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Cambridge, England : Royal Society of Chemistry
Pages: - Volume / Issue: 15 (16) Sequence Number: - Start / End Page: 5771 - 5781 Identifier: ISSN: 1463-9076
CoNE: /journals/resource/954925272413_1