Microstructural studies of Cu–Cr thin film structures grown by molecular beam 
epitaxy using advanced transmission electron microscopy

Harzer, T. P.; Dehm, G.

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Microstructural studies of Cu–Cr thin film structures grown by molecular beam epitaxy using advanced transmission electron microscopy

Harzer, T. P., & Dehm, G. (2012). Microstructural studies of Cu–Cr thin film structures grown by molecular beam epitaxy using advanced transmission electron microscopy. Poster presented at Macan Theromodynamics Workshop, Istanbul, Turkey.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-267C-D Versions-Permalink: https://hdl.handle.net/21.11116/0000-0002-90BE-5

Genre: Poster

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Urheber:
Harzer, T. P.¹, Autor
Dehm, G.^{1, 2}, Autor

Affiliations:
1Structure and Micro-/Nanomechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655