Advanced analysis of 3D EBSD data obtained by FIB tomography

Konijnenberg, Peter Joachim; Zaefferer, Stefan; Raabe, Dierk

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Advanced analysis of 3D EBSD data obtained by FIB tomography

Konijnenberg, P. J., Zaefferer, S., & Raabe, D. (2012). Advanced analysis of 3D EBSD data obtained by FIB tomography. Talk presented at NVvM 2012 Materials Science Meeting. Eindhoven, The Netherlands. 2012-10-25.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-26A9-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0008-DEB0-7

Genre: Talk

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Creators:
Konijnenberg, Peter Joachim¹, Author
Zaefferer, Stefan¹, Author
Raabe, Dierk², Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Created: 2012-10-25

Publication Status: Not specified

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Title: NVvM 2012 Materials Science Meeting

Place of Event: Eindhoven, The Netherlands

Start-/End Date: 2012-10-25

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