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  Atom probe tomography for nanoscale analysis of nitride thin films

Povstugar, I., Choi, P., Tytko, D., & Raabe, D. (2012). Atom probe tomography for nanoscale analysis of nitride thin films. Talk presented at 7th International Conference on Surfaces, Coatings and Nanostructured Materials NANOSMAT-2012. Prague, Chech Republic. 2012-09-18 - 2012-09-21.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-276B-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-41FA-3
Genre: Talk

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 Creators:
Povstugar, I.1, Author              
Choi, P.1, Author              
Tytko, D.1, Author              
Raabe, D.2, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2012-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 618616
 Degree: -

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Title: 7th International Conference on Surfaces, Coatings and Nanostructured Materials NANOSMAT-2012
Place of Event: Prague, Chech Republic
Start-/End Date: 2012-09-18 - 2012-09-21
Invited: Yes

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