Atom probe tomography for nanoscale analysis of nitride thin films

Povstugar, I.; Choi, P.; Tytko, D.; Raabe, D.

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Atom probe tomography for nanoscale analysis of nitride thin films

Povstugar, I., Choi, P., Tytko, D., & Raabe, D. (2012). Atom probe tomography for nanoscale analysis of nitride thin films. Talk presented at 7th International Conference on Surfaces, Coatings and Nanostructured Materials NANOSMAT-2012. Prague, Chech Republic. 2012-09-18 - 2012-09-21.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-276B-B Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-41FA-3

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Urheber:
Povstugar, I.¹, Autor
Choi, P.¹, Autor
Tytko, D.¹, Autor
Raabe, D.², Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381