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  New insights on quantitative microstructure characterization by electron channeling contrast imaging under controlled diffraction conditions in the SEM

Gutiérrez-Urrutia, I., & Raabe, D. (2012). New insights on quantitative microstructure characterization by electron channeling contrast imaging under controlled diffraction conditions in the SEM. Talk presented at Microscopy & Microanalysis. Phoenix, AZ, USA. 2012-07-30 - 2012-08-02.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2853-8 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-D343-4
Genre: Talk

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 Creators:
Gutiérrez-Urrutia, I.1, Author              
Raabe, D.1, Author              
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 619058
 Degree: -

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Title: Microscopy & Microanalysis
Place of Event: Phoenix, AZ, USA
Start-/End Date: 2012-07-30 - 2012-08-02

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