Study of impurities redistribution inside the cigs absorber layer by atom probe 
tomography

Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.

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Study of impurities redistribution inside the cigs absorber layer by atom probe tomography

Schwarz, T., Cojocaru-Mirédin, O., Choi, P., & Würz, R. (2012). Study of impurities redistribution inside the cigs absorber layer by atom probe tomography. Talk presented at Photovoltaic Technical Conference - Thin Film & Advanced Silicon Solutions 2012 (PVTC 2012). Aix-en-Provence, France. 2012-06-06 - 2012-06-08.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2921-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-D37A-7

Genre: Talk

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Creators:
Schwarz, T.¹, Author
Cojocaru-Mirédin, O.¹, Author
Choi, P.¹, Author
Würz, R., Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384

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Language(s): eng - English

Dates: Created: 2012-06

Publication Status: Not specified

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Identifiers: eDoc: 636060

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Title: Photovoltaic Technical Conference - Thin Film & Advanced Silicon Solutions 2012 (PVTC 2012)

Place of Event: Aix-en-Provence, France

Start-/End Date: 2012-06-06 - 2012-06-08

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