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  A Sample Holder System that Enables Sophisticated TEM Analysis of APT Tips

Herbig, M., Choi, P., & Raabe, D. (2012). A Sample Holder System that Enables Sophisticated TEM Analysis of APT Tips. Poster presented at International Field Emission Symposium 2012, Tuscaloosa, AL, USA.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-297F-4 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-9168-5
Genre: Poster

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 Creators:
Herbig, M.1, Author              
Choi, P.1, Author              
Raabe, D.2, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2012-05
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 655085
 Degree: -

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Title: International Field Emission Symposium 2012
Place of Event: Tuscaloosa, AL, USA
Start-/End Date: 2012-05-21 - 2012-05-25

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