English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Thin Film Metrology

Erbe, A. (2012). Thin Film Metrology. Talk presented at Seminar "Thin Film Metrology" (together with SENTECH Instruments). MPIE, Düsseldorf, Germany. 2012-03-01 - 2012-03-01.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2B36-5 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2B38-1
Genre: Talk

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Erbe, A.1, Author              
Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

Content

show

Details

show
hide
Language(s): eng - English
 Dates:
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 610920
 Degree: -

Event

show
hide
Title: Seminar "Thin Film Metrology" (together with SENTECH Instruments)
Place of Event: MPIE, Düsseldorf, Germany
Start-/End Date: 2012-03-01 - 2012-03-01

Legal Case

show

Project information

show

Source

show