Improving the Reliability of EBSD-based Texture Analysis by a New Large Area 
Mapping Technique

Davut, K.; Zaefferer, S.

doi:10.4028/www.scientific.net/MSF.702-703.566

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Improving the Reliability of EBSD-based Texture Analysis by a New Large Area Mapping Technique

Davut, K., & Zaefferer, S. (2012). Improving the Reliability of EBSD-based Texture Analysis by a New Large Area Mapping Technique. Materials Science Forum, 702-703, 566-569. doi:10.4028/www.scientific.net/MSF.702-703.566.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2C57-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2C59-2

Genre: Journal Article

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Creators:
Davut, K.¹, Author
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Date issued: 2012

Publication Status: Issued

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Identifiers: eDoc: 580678
DOI: 10.4028/www.scientific.net/MSF.702-703.566

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Title: Materials Science Forum

Alternative Title : Mater. Sci. Forum

Source Genre: Journal

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Pages: - Volume / Issue: 702-703 Sequence Number: - Start / End Page: 566 - 569 Identifier: -