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  Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications

Choi, P., Cojocaru-Mirédin, O., Abou-Ras, D., Caballero, R., Raabe, D., Smentkowski, V., et al. (2012). Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications. Microscopy Today, 20(3), 18-24.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2CAF-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2CB1-7
Genre: Journal Article

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 Creators:
Choi, P.1, Author              
Cojocaru-Mirédin, O.1, Author              
Abou-Ras, D., Author
Caballero, R., Author
Raabe, D.2, Author              
Smentkowski, V., Author
Park, C. G., Author
Gu, G. H., Author
Mazumder, B., Author
Wong, M. H., Author
Hu, Y.-L., Author
Melo, T. P., Author
Speck, J. S., Author
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 611054
 Degree: -

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Title: Microscopy Today
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 20 (3) Sequence Number: - Start / End Page: 18 - 24 Identifier: -