Atom-Probe Tomography of compound semiconductors for photovoltaic and 
light-emitting device applications

Choi, P.; Cojocaru-Mirédin, O.; Abou-Ras, D.; Caballero, R.; Raabe, D.; Smentkowski, V.; Park, C. G.; Gu, G. H.; Mazumder, B.; Wong, M. H.; Hu, Y.-L.; Melo, T. P.; Speck, J. S.

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Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications

Choi, P., Cojocaru-Mirédin, O., Abou-Ras, D., Caballero, R., Raabe, D., Smentkowski, V., et al. (2012). Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications. Microscopy Today, 20(3), 18-24.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2CAF-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2CB1-7

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Urheber:
Choi, P.¹, Autor
Cojocaru-Mirédin, O.¹, Autor
Abou-Ras, D., Autor
Caballero, R., Autor
Raabe, D.², Autor
Smentkowski, V., Autor
Park, C. G., Autor
Gu, G. H., Autor
Mazumder, B., Autor
Wong, M. H., Autor
Hu, Y.-L., Autor
Melo, T. P., Autor
Speck, J. S., Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381