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  New insights on quantitative microstructure characterization by electron channeling contrast imaging under controlled diffraction conditions in SEM

Gutiérrez-Urrutia, I., & Raabe, D. (2012). New insights on quantitative microstructure characterization by electron channeling contrast imaging under controlled diffraction conditions in SEM. Microscopy and Microanalysis, 18(2), 686-687. doi:10.1017/S1431927612005284.

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 Creators:
Gutiérrez-Urrutia, I.1, Author           
Raabe, D.1, Author           
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 618523
DOI: 10.1017/S1431927612005284
 Degree: -

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Title: Microscopy and Microanalysis
  Alternative Title : Microsc. Microanal.
Source Genre: Journal
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Pages: - Volume / Issue: 18 (2) Sequence Number: - Start / End Page: 686 - 687 Identifier: -