Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography

Zaefferer, S.; Konijnenberg, P.

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Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography

Zaefferer, S., & Konijnenberg, P. (2012). Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography. In J. Shields, S. McKernan, L. Brewer, T. Ruiz, & D. Turnquist (Eds.), Proceedings of M&M 2012 (pp. 520-521). Microscopy Society of America.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2DC1-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2DC3-8

Genre: Conference Paper

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Creators:
Zaefferer, S.¹, Author
Konijnenberg, P.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Date issued: 2012

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 624819

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Title: Microscopy & Microanalysis 2012

Place of Event: Phoenix, AZ, USA

Start-/End Date: 2012-07-29 - 2012-08-02

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Title: Proceedings of M&M 2012

Source Genre: Proceedings

Creator(s):
Shields, J., Editor
McKernan, S., Editor
Brewer, L., Editor
Ruiz, T., Editor
Turnquist, D., Editor

Affiliations:
-

Publ. Info: Microscopy Society of America

Pages: CD-ROM Volume / Issue: - Sequence Number: - Start / End Page: 520 - 521 Identifier: -