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  Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography

Zaefferer, S., & Konijnenberg, P. (2012). Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography. In J. Shields, S. McKernan, L. Brewer, T. Ruiz, & D. Turnquist (Eds.), Proceedings of M&M 2012 (pp. 520-521). Microscopy Society of America.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2DC1-C Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2DC3-8
Genre: Conference Paper

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 Creators:
Zaefferer, S.1, Author              
Konijnenberg, P.1, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 624819
 Degree: -

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Title: Microscopy & Microanalysis 2012
Place of Event: Phoenix, AZ, USA
Start-/End Date: 2012-07-29 - 2012-08-02

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Title: Proceedings of M&M 2012
Source Genre: Proceedings
 Creator(s):
Shields, J., Editor
McKernan, S., Editor
Brewer, L., Editor
Ruiz, T., Editor
Turnquist, D., Editor
Affiliations:
-
Publ. Info: Microscopy Society of America
Pages: CD-ROM Volume / Issue: - Sequence Number: - Start / End Page: 520 - 521 Identifier: -