Improving the Reliability of EBSD-based Texture Analysis by a New Large Area 
Mapping Technique

Davut, K.; Zaefferer, S.

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Improving the Reliability of EBSD-based Texture Analysis by a New Large Area Mapping Technique

Davut, K., & Zaefferer, S. (2011). Improving the Reliability of EBSD-based Texture Analysis by a New Large Area Mapping Technique. Talk presented at International Conference on the Textures of Materials, ICOTOM 16. Mumbai, India. 2011-12-12 - 2011-12-17.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2E5B-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2E5D-A

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Creators:
Davut, K.¹, Author
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

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Identifiers: eDoc: 580675

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Title: International Conference on the Textures of Materials, ICOTOM 16

Place of Event: Mumbai, India

Start-/End Date: 2011-12-12 - 2011-12-17

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