Atomic Analysis of Concentration Changes at Interfaces by Atom Probe Tomography

Herbig, M.; Li, Y.; Choi, P.

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Atomic Analysis of Concentration Changes at Interfaces by Atom Probe Tomography

Herbig, M., Li, Y., & Choi, P. (2011). Atomic Analysis of Concentration Changes at Interfaces by Atom Probe Tomography. Talk presented at SFB 761 Doktorandenseminar. RWTH Aachen, Germany. 2011-11-24.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2EC1-4 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2EC3-F

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Urheber:
Herbig, M.¹, Autor
Li, Y.^{1, 2}, Autor
Choi, P.¹, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392