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  Identical-location TEM investigations of Pt/C electrocatalyst degradation at elevated temperatures

Schlögl, K., Mayrhofer, K. J. J., Hanzlik, M., & Arenz, M. (2011). Identical-location TEM investigations of Pt/C electrocatalyst degradation at elevated temperatures. Journal of Electroanalytical Chemistry, 662(2), 355-360. doi:10.1016/j.jelechem.2011.09.003.

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 Creators:
Schlögl, Katrin1, Author           
Mayrhofer, Karl Johann Jakob2, Author           
Hanzlik, Marianne3, Author           
Arenz, Matthias4, Author           
Affiliations:
1Department of Chemistry, Copenhagen University, Copenhagen, DK-2100, Denmark, ou_persistent22              
2Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863354              
3Institut für Elektronenmikroskopie, Technische Universität München, Lichtenbergstr. 4, D-85748 Garching, Germany, ou_persistent22              
4Department of Chemistry, University of Copenhagen, Universitetsparken 5, DK-2100 Copenhagen, Denmark, ou_persistent22              

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Language(s): eng - English
 Dates: 2011-11-15
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 579699
DOI: 10.1016/j.jelechem.2011.09.003
 Degree: -

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Title: Journal of Electroanalytical Chemistry
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier
Pages: - Volume / Issue: 662 (2) Sequence Number: - Start / End Page: 355 - 360 Identifier: ISSN: 0022-0728
CoNE: https://pure.mpg.de/cone/journals/resource/954928572675