Characterization of grain boundaries in Cu(In,Ga)Se2 thin-film using APT

Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Abou-Ras, D.; Liu, T.; Schmidt, S. S.; Caballero, R.; Raabe, D.

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Characterization of grain boundaries in Cu(In,Ga)Se₂ thin-film using APT

Cojocaru-Mirédin, O., Choi, P., Wuerz, R., Abou-Ras, D., Liu, T., Schmidt, S. S., et al. (2011). Characterization of grain boundaries in Cu(In,Ga)Se₂ thin-film using APT. Talk presented at 1st Workshop on Characterization of Grain Boundaries in CIGS-thin films. Berlin, Germany. 2011-10-31.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2F11-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2F13-6

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Creators:
Cojocaru-Mirédin, O.¹, Author
Choi, P.¹, Author
Wuerz, R., Author
Abou-Ras, D., Author
Liu, T.², Author
Schmidt, S. S., Author
Caballero, R., Author
Raabe, D.³, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

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Identifiers: eDoc: 576244

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Title: 1st Workshop on Characterization of Grain Boundaries in CIGS-thin films

Place of Event: Berlin, Germany

Start-/End Date: 2011-10-31

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