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  Characterization of grain boundaries in Cu(In,Ga)Se2 thin-film using APT

Cojocaru-Mirédin, O., Choi, P., Wuerz, R., Abou-Ras, D., Liu, T., Schmidt, S. S., et al. (2011). Characterization of grain boundaries in Cu(In,Ga)Se2 thin-film using APT. Talk presented at 1st Workshop on Characterization of Grain Boundaries in CIGS-thin films. Berlin, Germany. 2011-10-31.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2F11-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-2F13-6
Genre: Talk

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 Creators:
Cojocaru-Mirédin, O.1, Author              
Choi, P.1, Author              
Wuerz, R., Author
Abou-Ras, D., Author
Liu, T.2, Author              
Schmidt, S. S., Author
Caballero, R., Author
Raabe, D.3, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 576244
 Degree: -

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Title: 1st Workshop on Characterization of Grain Boundaries in CIGS-thin films
Place of Event: Berlin, Germany
Start-/End Date: 2011-10-31

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