Atomic-scale analysis of the p-n junction in CI(G)S thin-film solar cells

Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.

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Atomic-scale analysis of the p-n junction in CI(G)S thin-film solar cells

Cojocaru-Mirédin, O., Choi, P., Wuerz, R., & Raabe, D. (2011). Atomic-scale analysis of the p-n junction in CI(G)S thin-film solar cells. Poster presented at Euromat 2011, Montpellier, France.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2FDF-D Versions-Permalink: https://hdl.handle.net/21.11116/0000-0002-9245-B

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Urheber:
Cojocaru-Mirédin, O.¹, Autor
Choi, P.¹, Autor
Wuerz, R., Autor
Raabe, D.², Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381